Abstract Details
| Determining the Molecular Packing in Monolayer-thin Organic Semiconductor Layers | |
|---|---|
| Abstract ID | MAT-11 |
| Presenter | Stefan Mannsfeld |
| Presentation Type | Poster |
| Full Author List | S. Mannsfeld (1) , A. Virkar (1) , Q. Yuan (1) , M. L. Tang (1) , M. F. Toney (2) , Z. Bao (1) |
| Affiliations | (1) Stanford University, Chemical Engineering, Stanford, CA (2) SSRL, SLAC, Stanford, CA |
| Category | Materials Science |
| Abstract | The charge transport in organic thin film field effect transistors occurs predominantly in the first few monolayers at the dielectric interface [1]. Consequently, the structural characterization of thicker films by standard X-ray diffraction or bulk crystals of the same material only reveal very limited information about the more relevant molecular packing in these first monolayers. Grazing incidence X-ray diffraction (GIXD) using a synchrotron light source can provide structural information on ultra-thin films down to a single monolayer that are not accessible by the aforementioned techniques. Using GIXD and crystallographic refinement calculations, we determine the packing of the molecules in monolayer films of oligothiophenes and various pentacene derivatives. With the known molecular arrangement, quantum-chemical calculation can then be used to reason the performance of the corresponding thin film transistor devices. |
| Footnotes | [1] A. Dodapalapur, L. Torsi, and H. E. Katz, Organic Transistors: Two-dimensional transport and improved electrical characteristics, Science 268, 270-917 (1995). |
| Funding Acknowledgement | |