SSRL/LCLS

Abstract Details

Application of Dispersive EXAFS to Study Subnanosecond Materials Dynamics
Abstract IDW_EXAFS-11 
PresenterPatrick  Allen
Presentation TypeEXAFS Workshop - SSRL
Full Author ListP. G. Allen (1) , B. A. Remington (1) , S. M. Pollaine (1) , H. E. Lorenzana (1) , K. T. Lorenz (1) , J. A. Hawreliak (1) , B. Yaakobi (2) , T. R. Boehly (2) , T. C. Sangster (2) , D. D. Meyerhofer (2)
Affiliations(1) Lawrence Livermore National Laboratory, Livermore, CA 94550, USA
(2) Laboratory for Laser Energetics, University of Rochester, 250 E. River Rd, Rochester, NY 14623, USA
CategoryMaterials Science
AbstractMonitoring and elucidating the nature of chemical and materials transformations by direct structural probes in real time remains an important challenge across many scientific disciplines. Regarding XAFS measurements, in particular, numerous experimental approaches have been developed for achieving time resolution. Amongst these approaches, dispersive XAFS has the ability to acquire a complete structural signature in a "single shot" and at a time resolution dictated directly by the source brightness. With the advent of brighter sources such as the LCLS or laser driven sources, it is now possible to achieve single shot, subnanosecond resolution using a dispersive XAFS configuration. Applications of this methodology using a laser-imploded target radiation source will be discussed, including examples of shock driven material compression and phase transformation.
Footnotes 
Funding Acknowledgement