  |
X-Ray Polarimetry Workshop SLAC, Stanford, California 9-11 February 2004 |
| NASA Site Home | | SLAC Site Home | | Talks on the Web | | Poster (PDF) | |
Development of a Compton Camera based on high resolution Si/CdTe imaging devicesand the demonstration of the polarimetric measurement
Takefumi
Mitani
ISAS/JAXA, JAPAN
mitani@astro.isas.jaxa.jp
Takefumi Mitani, Takaaki Tanaka, Kousuke Oonuki, Kazuhiro Nakazawa, Takeshi Takashima, Tadayuki Takahashi, Hiroyasu Tajima, Yasushi Fukazawa, Tatsuya Nakamoto, Masaharu Nomachi, Hidehito Nakamura
(Poster) A new generation of a high sensitive Compton Telescope based on semiconductors is believed to bring a breakthrough in the observation of the gamma-ray universe. An important feature of the telescope other than its sensitivity is the capability to measure the polarization of photons, which is directly connected with the emission mechanism. We are planning to launch such telescope into orbit around 2010, as the Soft Gamma-ray Detector(SGD) on board the Japanese "NeXT" mission. To realize such a Compton Telescope, we have been developing a stack of high resolution CdTe and Si imaging devices. Based on the recent achievements of the high resolution CdTe diode and a low noise analog LSI, we have developed an 18 mm x 18 mm CdTe pixel detector with a positional resolution of 2 mm. Utilizing the CdTe detector and a double-sided Si strip detector(DSSD), we constructed the first prototype Si/CdTe Compton telescope. In order to prove the performance, we irradiate 100% linearly polarized 170keV gamma-ray line to the system and obtain the polarimetric modulation factor of 43%, which agrees with the prediction of our Monte Carlo simulation.
|
For more information, contact
Jennifer Formichelli |
||
 |
 |
|